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Stacking and twinning fault energies for fcc User01 v001
Description Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc User01 at zero temperature and pressure.
The supported atomic species.
A statement of applicability provided by the contributor, informing users of the intended use of this KIM Item.
Contributor Subrahmanyam Pattamatta
Maintainer Subrahmanyam Pattamatta
Published on KIM 2019
How to Cite

This Test originally published in [1] is archived in OpenKIM [2-5].

[1] Bernstein N, Tadmor EB. Tight-binding calculations of stacking energies and twinnability in fcc metals. Physical Review B. 2004Mar;69(9):094116. doi:10.1103/PhysRevB.69.094116

[2] Stacking and twinning fault energies for fcc User01 v001. OpenKIM; 2019.

[3] Stacking and twinning fault energies of an fcc lattice at zero temperature and pressure v002. OpenKIM; 2019. doi:10.25950/b4cfaf9a

[4] Tadmor EB, Elliott RS, Sethna JP, Miller RE, Becker CA. The potential of atomistic simulations and the Knowledgebase of Interatomic Models. JOM. 2011;63(7):17. doi:10.1007/s11837-011-0102-6

[5] Elliott RS, Tadmor EB. Knowledgebase of Interatomic Models (KIM) Application Programming Interface (API). OpenKIM; 2011. doi:10.25950/ff8f563a

Click here to download the above citation in BibTeX format.
Funding Not available
Short KIM ID
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Extended KIM ID
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Citable Link https://openkim.org/cite/TE_962731130474_001
KIM Item TypeTest
Properties as defined in kimspec.edn. These properties are inhereted from the Test Driver.
KIM API Version2.0
Simulator Name
The name of the simulator as defined in kimspec.edn. This Simulator Name is inhereted from the Test Driver.
Programming Language(s)
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100.00% Python
Previous Version StackingFaultFccCrystal_0bar_User01__TE_962731130474_000

Model Test Results Link to Test Results page Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.

Measured in Millions of Whetstone Instructions (MWI)
TIDP_RajanWarnerCurtin_2016A_User01__MO_514760222899_001 view 1814472
TIDP_RajanWarnerCurtin_2016B_User01__MO_217710069583_001 view 1887980
TIDP_RajanWarnerCurtin_2016C_User01__MO_072437275969_001 view 1934068
TIDP_RajanWarnerCurtin_2016D_User01__MO_791486224463_001 view 1879640
TIDP_RajanWarnerCurtin_2016E_User01__MO_971845881377_001 view 1831404
TIDP_RajanWarnerCurtin_2016F_User01__MO_246297839798_001 view 1685147

This Test requires a Test Driver. Archives for the Test Driver StackingFaultFccCrystal__TD_228501831190_002 appear below.

StackingFaultFccCrystal__TD_228501831190_002.txz Tar+XZ Linux and OS X archive
StackingFaultFccCrystal__TD_228501831190_002.zip Zip Windows archive
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