| Title
A single sentence description.
|
Stacking and twinning fault energies for fcc Kr |
|---|---|
| Description | Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc Kr at zero temperature and pressure. |
| Species
The supported atomic species.
| Kr |
| Disclaimer
A statement of applicability provided by the contributor, informing users of the intended use of this KIM Item.
|
None |
| Contributor |
Subrahmanyam Pattamatta |
| Maintainer |
Subrahmanyam Pattamatta |
| Published on KIM | 2018 |
| How to Cite |
There is a newer version of this item. See StackingFaultFccCrystal_0bar_Kr__TE_921811007024_002 This Test originally published in [1] is archived in OpenKIM [2-5]. [1] Bernstein N, Tadmor EB. Tight-binding calculations of stacking energies and twinnability in fcc metals. Physical Review B. 2004Mar;69(9):094116. doi:10.1103/PhysRevB.69.094116 [2] Pattamatta S. Stacking and twinning fault energies for fcc Kr [Internet]. OpenKIM; 2018. Available from: https://openkim.org/cite/TE_921811007024_001 [3] Pattamatta S. Stacking and twinning fault energies of an fcc lattice at zero temperature and pressure v001. OpenKIM; 2018. doi:10.25950/d6ffade7 [4] Tadmor EB, Elliott RS, Sethna JP, Miller RE, Becker CA. The potential of atomistic simulations and the Knowledgebase of Interatomic Models. JOM. 2011;63(7):17. doi:10.1007/s11837-011-0102-6 [5] Elliott RS, Tadmor EB. Knowledgebase of Interatomic Models (KIM) Application Programming Interface (API). OpenKIM; 2011. doi:10.25950/ff8f563a |
| Funding | Not available |
| Short KIM ID
The unique KIM identifier code.
| TE_921811007024_001 |
| Extended KIM ID
The long form of the KIM ID including a human readable prefix (100 characters max), two underscores, and the Short KIM ID. Extended KIM IDs can only contain alpha-numeric characters (letters and digits) and underscores and must begin with a letter.
| StackingFaultFccCrystal_Kr_0bar__TE_921811007024_001 |
| Citable Link | https://openkim.org/cite/TE_921811007024_001 |
| KIM Item Type | Test |
| Driver | StackingFaultFccCrystal__TD_228501831190_001 |
| Properties
Properties as defined in kimspec.edn.
These properties are inhereted from the Test Driver.
|
|
| KIM API Version | 2.0 |
| Simulator Name
The name of the simulator as defined in kimspec.edn.
This Simulator Name is inhereted from the Test Driver.
| lammps |
| Programming Language(s)
The programming languages used in the code and the percentage of the code written in each one.
| 100.00% Python |
| Previous Version | StackingFaultFccCrystal_Kr_0bar__TE_921811007024_000 |
| Model | Test Results | Link to Test Results page | Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.
Measured in Millions of Whetstone Instructions (MWI) |
|---|---|---|---|
| LJ_Shifted_Bernardes_1958HighCutoff_Kr__MO_923895531627_003 | view | 58947268 | |
| LJ_Shifted_Bernardes_1958LowCutoff_Kr__MO_995724792024_003 | view | 6354434 | |
| LJ_Shifted_Bernardes_1958MedCutoff_Kr__MO_984281096460_003 | view | 20613233 |
| Model | Error Categories | Link to Error page |
|---|---|---|
| LJ_ElliottAkerson_2015_Universal__MO_959249795837_003 | other | view |
This Test requires a Test Driver. Click below for the Test Driver StackingFaultFccCrystal__TD_228501831190_001 archive.