A single sentence description.
|Stacking and twinning fault energies for fcc Ac|
|Description||Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc Ac at zero temperature and pressure.|
The supported atomic species.
A statement of applicability provided by the contributor, informing users of the intended use of this KIM Item.
|How to Cite||Click here to download this citation in BibTeX format.|
|Short KIM ID
The unique KIM identifier code.
|Extended KIM ID
The long form of the KIM ID including a human readable prefix (100 characters max), two underscores, and the Short KIM ID. Extended KIM IDs can only contain alpha-numeric characters (letters and digits) and underscores and must begin with a letter.
|KIM Item Type||Test|
Properties as defined in kimspec.edn. These properties are inhereted from the Test Driver.
|KIM API Version||1.9.0|
The name of the simulator as defined in kimspec.edn. This Simulator Name is inhereted from the Test Driver.
The programming languages used in the code and the percentage of the code written in each one.
|Model||Test Results||Link to Test Results page||Benchmark time
Usertime muliplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.
Measured in Millions of Whetstone Instructions (MWI)
|StackingFaultFccCrystal_Ac_0bar__TE_567672586460_000.txz||Tar+XZ||Linux and OS X archive|