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StackingFaultFccCrystal_Xe_0bar__TE_772546695950_000

Title
A single sentence description.
Stacking and twinning fault energies for fcc Xe
Description Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc Xe at zero temperature and pressure.
Species
The supported atomic species.
Xe
Disclaimer
A statement of applicability provided by the contributor, informing users of the intended use of this KIM Item.
None
Contributor Subrahmanyam Pattamatta
Maintainer Subrahmanyam Pattamatta
Published on KIM 2018
How to Cite Click here to download this citation in BibTeX format.
Funding Not available
Short KIM ID
The unique KIM identifier code.
TE_772546695950_000
Extended KIM ID
The long form of the KIM ID including a human readable prefix (100 characters max), two underscores, and the Short KIM ID. Extended KIM IDs can only contain alpha-numeric characters (letters and digits) and underscores and must begin with a letter.
StackingFaultFccCrystal_Xe_0bar__TE_772546695950_000
Citable Link https://openkim.org/cite/TE_772546695950_000
KIM Item TypeTest
DriverStackingFaultFccCrystal__TD_228501831190_000
Properties
Properties as defined in kimspec.edn. These properties are inhereted from the Test Driver.
KIM API Version1.9.0
Simulator Name
The name of the simulator as defined in kimspec.edn. This Simulator Name is inhereted from the Test Driver.
lammps
Programming Language(s)
The programming languages used in the code and the percentage of the code written in each one.
100.00% Python


EAM_Dynamo__MD_120291908751_004
Model Test Results Link to Test Results page Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.

Measured in Millions of Whetstone Instructions (MWI)
EAM_Dynamo_Smirnova_UMoXe__MO_679329885632_004 view 77807
LennardJones612__MD_414112407348_002
Model Test Results Link to Test Results page Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.

Measured in Millions of Whetstone Instructions (MWI)
LennardJones612_UniversalShifted__MO_959249795837_002 view 10154649
Pair_Lennard_Jones_Shifted__MD_498634107543_002
Model Test Results Link to Test Results page Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.

Measured in Millions of Whetstone Instructions (MWI)
Pair_Lennard_Jones_Shifted_Bernardes_HighCutoff_Xe__MO_796748253903_002 view 142557640
Pair_Lennard_Jones_Shifted_Bernardes_LowCutoff_Xe__MO_648694198005_002 view 13710854
Pair_Lennard_Jones_Shifted_Bernardes_MedCutoff_Xe__MO_849320763277_002 view 45092806


  • No Errors associated with this Test




This Test requires a Test Driver. Archives for the Test Driver StackingFaultFccCrystal__TD_228501831190_000 appear below.


StackingFaultFccCrystal__TD_228501831190_000.txz Tar+XZ Linux and OS X archive
StackingFaultFccCrystal__TD_228501831190_000.zip Zip Windows archive
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