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StackingFaultFccCrystal_Ir_0bar__TE_919855379475_000

Title
A single sentence description.
Stacking and twinning fault energies for fcc Ir
Description Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc Ir at zero temperature and pressure.
Species
The supported atomic species.
Ir
Disclaimer
A statement of applicability provided by the contributor, informing users of the intended use of this KIM Item.
None
Contributor Subrahmanyam Pattamatta
Maintainer Subrahmanyam Pattamatta
Published on KIM 2018
How to Cite Click here to download this citation in BibTeX format.
Funding Not available
Short KIM ID
The unique KIM identifier code.
TE_919855379475_000
Extended KIM ID
The long form of the KIM ID including a human readable prefix (100 characters max), two underscores, and the Short KIM ID. Extended KIM IDs can only contain alpha-numeric characters (letters and digits) and underscores and must begin with a letter.
StackingFaultFccCrystal_Ir_0bar__TE_919855379475_000
Citable Link https://openkim.org/cite/TE_919855379475_000
KIM Item TypeTest
DriverStackingFaultFccCrystal__TD_228501831190_000
Properties
Properties as defined in kimspec.edn. These properties are inhereted from the Test Driver.
KIM API Version1.9.0
Simulator Name
The name of the simulator as defined in kimspec.edn. This Simulator Name is inhereted from the Test Driver.
lammps
Programming Language(s)
The programming languages used in the code and the percentage of the code written in each one.
100.00% Python


LennardJones612__MD_414112407348_002
Model Test Results Link to Test Results page Benchmark time
Usertime multiplied by the Whetstone Benchmark. This number can be used (approximately) to compare the performance of different models independently of the architecture on which the test was run.

Measured in Millions of Whetstone Instructions (MWI)
LennardJones612_UniversalShifted__MO_959249795837_002 view 15279921


  • No Errors associated with this Test




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StackingFaultFccCrystal__TD_228501831190_000.zip Zip Windows archive
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