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StackingFaultFccCrystal_Ne_0bar__TE_599637705633_001

Title
A single sentence description.
Stacking and twinning fault energies for fcc Ne
Description Intrinsic and extrinsic stacking fault energies, unstable stacking fault energy, unstable twinning energy, stacking fault energy as a function of fractional displacement, and gamma surface for fcc Ne at zero temperature and pressure.
Species
The supported atomic species.
Ne
Contributor SubrahmanyamPattamatta
Maintainer SubrahmanyamPattamatta
Author Subrahmanyam Pattamatta
Publication Year 2018
Source Citations
A citation to primary published work(s) that describe this KIM Item.

Bernstein N, Tadmor EB (2004) Tight-binding calculations of stacking energies and twinnability in fcc metals. Physical Review B 69(9):094116. doi:10.1103/PhysRevB.69.094116

Item Citation Click here to download a citation in BibTeX format.
Short KIM ID
The unique KIM identifier code.
TE_599637705633_001
Extended KIM ID
The long form of the KIM ID including a human readable prefix (100 characters max), two underscores, and the Short KIM ID. Extended KIM IDs can only contain alpha-numeric characters (letters and digits) and underscores and must begin with a letter.
StackingFaultFccCrystal_Ne_0bar__TE_599637705633_001
Citable Link https://openkim.org/cite/TE_599637705633_001
KIM Item TypeTest
DriverStackingFaultFccCrystal__TD_228501831190_001
Properties
Properties as defined in kimspec.edn. These properties are inhereted from the Test Driver.
KIM API Version2.0
Simulator Name
The name of the simulator as defined in kimspec.edn. This Simulator Name is inhereted from the Test Driver.
lammps
Programming Language(s)
The programming languages used in the code and the percentage of the code written in each one.
100.00% Python
Previous Version StackingFaultFccCrystal_Ne_0bar__TE_599637705633_000


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Model Test Results Link to Test Results page Benchmark time
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Measured in Millions of Whetstone Instructions (MWI)
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